SPECIFICATIONS
SUBMICRON REPEATABILITY
System accuracy is dependent upon measurement volume. Factory specification of entire system volume is 1.5+2L/1000 (μm).
Coupling 262x magnification with small measurement volume accuracy allows us to measure high tolerance artifacts with a high density of features.
Vision is the best method for measuring 2D applications such as locations tactile probes can’t touch, inscriptions, graphics, bar & QR codes, scratches, various labels, and more.
